Blank Cover Image

DEEP LEVELS AT COMPOUND-SEMICONDUCTOR INTERFACES

著者名:
Monch W.  
掲載資料名:
The physics of submicron semiconductor devices
シリーズ名:
NATO ASI series. Series B, Physics
シリーズ巻号:
180
発行年:
1988
開始ページ:
253
終了ページ:
287
総ページ数:
35
出版情報:
New York: Plenum Press
ISBN:
9780306429866 [0306429861]
言語:
英語
請求記号:
N11479/180
資料種別:
国際会議録

類似資料:

1 国際会議録 Electronic characterization of compound semeconductor surfaces and interfaces

Monch, w.

North-Holland
7 国際会議録 COMPOUND SEMICONDUCTOR SURFACES AND INTERFACES: WHENCE FERMI LEVEL PINNING?

Woodall, J. M.

Materials Research Society
2 国際会議録 Electronic Properties of Ideal and Interface-Modified Metal-Semiconductor Contacts

Monch, Winfried

MRS - Materials Research Society
8 国際会議録 *THERMODYNAMICS OF DEEP LEVELS IN SEMICONDUCTORS

Van Vechten, J. A.

Materials Research Society
3 国際会議録 DEEP LEVEL AT SEMICONDUCTOR SURFACES.

PLATEN,W., KOHL,D., BRAUCHLE,K.A., WOLTER,K.

Trans Tech Publications
9 国際会議録 ABSOLUTE PRESSURE DERIVATIVES OF DEEP LEVEL DEFECTS IN III-V SEMICONDUCTORS

Nolte, D. D., Walukiewicz, W., Haller, E. E.

Materials Research Society
4 国際会議録 Deep Levels and Bending at Metal - Semiconductor Interfaces

Brillson J. L., Chiaradia P.

Plenum Press
10 国際会議録 Formation energies and energy levels of deep defects in narrow-gap semiconductors

Patterson,J.D., Li,W.

SPIE-The International Society for Optical Engineering
5 国際会議録 Some Aspects of Surface Science Related to MBE

Monch W.

Martinus Nijhoff Publishers
11 国際会議録 Deep Impurity Levels in Semiconductors, Semiconductor Alloys, and Superlattices

Dow D. John, Ren Yuan Shang, Shen Jun

Plenum Press
6 国際会議録 DELTA DOPING FOR DEEP LEVEL ANALYSIS IN SEMICONDUCTORS

Piprek, J., Krispin, P., Kostial, H., Boer, K.W.

Materials Research Society
12 国際会議録 In-Situ Reflectance and Virtual Interface Analysis for Compound Semiconductor Process Control

Breiland, W.G., Hong, H.Q., Hammons, B.E., Klem, J.F.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12