Structured-light-based section outline sensor
- 著者名:
- 掲載資料名:
- Three-dimensional imaging, optical metrology, and inspection V : 19-20 September 1999, Boston, Massachusetts
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3835
- 発行年:
- 1999
- 開始ページ:
- 210
- 終了ページ:
- 214
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819434289 [0819434280]
- 言語:
- 英語
- 請求記号:
- P63600/3835
- 資料種別:
- 国際会議録
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