First measurements on a DEPFET active pixel matrix for x-ray imaging spectroscopy
- 著者名:
Klein,P. ( Univ.Dortmund ) Buchholz,P. Fischer,P. Hornel,N. Holl,P. Kemmer,J. Locker,M. Lutz,G. Neeser,W. Stotter,D. Struder,L. Trimpl,M. Ulrici,J. Vocht,J. - 掲載資料名:
- X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4012
- 発行年:
- 2000
- 開始ページ:
- 605
- 終了ページ:
- 611
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436375 [0819436372]
- 言語:
- 英語
- 請求記号:
- P63600/4012
- 資料種別:
- 国際会議録
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3
国際会議録
XEUS wide-field imager: first experimental results with the x-ray active pixel sensor DEPFET
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |