Analysis of deformable electroelastic devices:cumulative effects of weak electric conduction

Analysis of deformable electroelastic devices:cumulative effects of weak electric conduction

著者名:

Harper,J.E. ( MIT Active Materials and Structures Lab. )
Hagood,N.W.

掲載資料名:

Smart structures and materials 2000 : Active materials : behavior and mechanics : 6-9 March, 2000, Newport Beach, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3992

発行年:

2000

開始ページ:

25

終了ページ:

39

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819436108 [0819436100]

言語:

英語

請求記号:

P63600/3992

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020370
シリーズID:	PA00000029
会議名:	Smart structures and materials
回次:	2000
会議開催地:	Newport Beach, CA, USA
会議開催年:	2000.03.06-2000.03.09

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