Formation of High-Quality Oxynitride Gate Dielectrics by High Pressure Thermal Oxidation of Si in NO
- 著者名:
Song, S. C. Lee, C. H. Luan, H. F. Kwong, D. L. Gardner, M. Fulford, J. Allen, M. Bloom, J. Evans, R. - 掲載資料名:
- Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 567
- 発行年:
- 1999
- 開始ページ:
- 65
- 出版情報:
- Warrendale, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994744 [1558994742]
- 言語:
- 英語
- 請求記号:
- M23500/567
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
Electrochemical Society |
MRS - Materials Research Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
4
国際会議録
Enhanced Degradation in P+-Poly PMOSFETs With Oxynitride Gate Dielectrics Under Hot-Hole Injection
MRS - Materials Research Society |
Electrochemical Society |
MRS - Materials Research Society |
11
国際会議録
Characteristics of Ultra Thin (EOT<1 nm) RTCVD Zr Silicate (Zr 27Si 10O 63) Gate Dielectrics
Electrochemical Society |
Electrochemical Society |
Materials Research Society |