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Point Defect Interactions With Extended Defects in Silicon

著者名:
掲載資料名:
Multiscale modelling of materials : symposium held November 30-December 3, 1998, Boston, Massachusets, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
538
発行年:
1999
開始ページ:
419
出版情報:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994447 [1558994440]
言語:
英語
請求記号:
M23500/538
資料種別:
国際会議録

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