Influence of Structural Defects and Zinc Composition Variation on the Device Response of Cd1-xZnxTe Radiation Detectors
- 著者名:
Yoon, H. Scyoc, J. M. Van Gilbert, T. S. Goorsky, M. S. Brunett, B. A. Lund, J. C. Hermon, H. Schieber, M. James, R. B. - 掲載資料名:
- Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 487
- 発行年:
- 1997
- 開始ページ:
- 115
- 出版情報:
- Pittsburgh, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993921 [1558993924]
- 言語:
- 英語
- 請求記号:
- M23500/487
- 資料種別:
- 国際会議録
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