Quantitative High-Resolution Electron Microscopy of Grain Boundaries

Quantitative High-Resolution Electron Microscopy of Grain Boundaries

著者名:

掲載資料名:

Atomic resolution microscopy of surfaces and interfaces : symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

466

発行年:

1997

開始ページ:

119

出版情報:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993709 [1558993703]

言語:

英語

請求記号:

M23500/466

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020309
シリーズID:	PA00000011
会議名:	Symposium on atomic resolution microscopy of surfaces and interfaces
回次:	1996
会議開催地:	Boston, MA, USA
会議開催年:	1996.12.03-1996.12.05

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1 国際会議録 Determination of Grain Boundary Atomic Structure Using Quantitative High Resolution Electron Microscopy Campbell,G.H., King,W.E., Foiles,S.M., Cohen,D. Trans Tech Publications	7 国際会議録 HIGH-RESOLUTION ELECTRON MICROSCOPY OF PLANAR DEFECTS IN AlN McKernan, Stuart, Norton, Grant M., Carter, Barry C. Materials Research Society
2 国際会議録 QUANTITATIVE HREM STUDY OF THE ATOMIC STRUCTURE OF THE Σ(310)/[001] SYMMETRIC TILT GRAIN BOUNDARY IN Nb King, Wayne E., Campbell, Geoffrey H. Materials Research Society	8 国際会議録 HIGH-RESOLUTION ELECTRON MICROSCOPY OF HEMATITE FORMED BY EXTERNAL OXIDATION OF IRON-BEARING OLIVINE McKernan, Stuart, Rasmussen, Rene D., Carter Barry C. Materials Research Society
3 国際会議録 HIGH-RESOLUTION ELECTRON MICROSCOPY OF OLIVINE-MAGNETITE INTERFACES McKernan, Stuart, Barry Carter, C. Materials Research Society	9 国際会議録 HIGH RESOLUTION ELECTRON MICROSCOPY ON GRAIN BOUNDARIES IN OXIDE SUPERCONDUCTORS Zandbergen, H.W., Van Tendeloo, G. Materials Research Society
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