1.54-ｦﾌm emission enhancement in silicon doped with erbium

1.54-ｦﾌm emission enhancement in silicon doped with erbium

著者名:

Onopko,D.E. ( S.I.Vavilov State Optical Institute )
Bagraev,N.T.
Ryskin,A.I.

掲載資料名:

Tenth Feofilov Symposium on Spectroscopy of Crystals Activated by Rare-Earth and Transitional-Metal Ions

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2706

発行年:

1996

開始ページ:

251

終了ページ:

259

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420800 [0819420808]

言語:

英語

請求記号:

P63600/2706

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020261
シリーズID:	PA00000029
会議名:	Feofilov Symposium on Spectroscopy of Crystals Activated by Rare-Earth and Transitional-Metal Ions
回次:	1995 : 10th
会議開催地:	St. Petersburg, Russia
会議開催年:	1995.07.03-1995.07.07

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