High-resolution photoelectron yield spectroscopy of oxide superconductors

High-resolution photoelectron yield spectroscopy of oxide superconductors

著者名:

Kawasaki,M. ( Tokyo Institute of Technology )

掲載資料名:

Spectroscopic Studies of Superconductors Part B : Tunneling,Photoelectron,and Other Spectra : 29 January - 1 February 1996, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2696

発行年:

1996

巻:

PartB

開始ページ:

523

終了ページ:

532

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420701 [0819420700]

言語:

英語

請求記号:

P63600/2696

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020260
シリーズID:	PA00000029
会議名:	Photonics West : Spectroscopic Studies of Superconductors
回次:	1996
会議開催地:	San Jose, CA, USA
会議開催年:	1996.01.29-1996.02.01

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