Oblique-incidence reflectometry:one relative profile measurement of diffuse reflectance yields two optical parameters
- 著者名:
Wang,L. ( Univ.Texas M.D.Anderson Cancer Research Ctr. ) Lin,S.-P. Jacques,S.L. Tittel,F.K. Harder,J. Jancarik,J. Mammini,B.M. Small,W.IV Silva,L.B.Da - 掲載資料名:
- Proceedings of optical biopsies : 14-15 September 1995, Barcelona, Spain
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2627
- 発行年:
- 1995
- 開始ページ:
- 165
- 終了ページ:
- 175
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819419910 [0819419915]
- 言語:
- 英語
- 請求記号:
- P63600/2627
- 資料種別:
- 国際会議録
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