Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement
- 著者名:
- 掲載資料名:
- Semiconductor processing and characterization with lasers : applications in photovoltaics : proceedings of the First International Symposium, Stuttgart, Germany, April 18-20, 1994
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 173-174
- 発行年:
- 1995
- 開始ページ:
- 255
- 終了ページ:
- 258
- 出版情報:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878496839 [0878496831]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
MRS - Materials Research Society |
Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
5
国際会議録
Interpretation of Carrier Recombination Lifetime and Diffusion Length Measurements in Silicon
Electrochemical Society |
Materials Research Society |
Trans Tech Publications |
MRS - Materials Research Society |