High-resolution PITS studies of deep-level defects in semi-insulating GaAs and InP

著者名:

• Kaminski,P. ( Institute of Electronic Materials Technology (Poland) )
• Pawlowski,M. ( Military Univ.of Technology (Poland) )
• Kozlowski,R. ( Institute of Electronic Materials Technology (Poland) )
• Cwirko,R. ( Military Univ.of Technology (Poland) )
• Palczewska,M. ( Institute of Electronic Materials Technology (Poland) )

掲載資料名:

Solid state crystals, growth and characterization : 7-11 October 1996, Zakopane, Poland

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3178

発行年:

1997

開始ページ:

246

終了ページ:

250

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819426048 [0819426040]

言語:

英語

請求記号:

P63600/3178

資料種別:

国際会議録