Uniform stress effect on initial stages of oxygen precipitation in Czochralski-grown silicon (Invited Paper)
- 著者名:
- Misiuk,A. ( Institute of Electron Technology (Poland) )
- 掲載資料名:
- Solid state crystals, growth and characterization : 7-11 October 1996, Zakopane, Poland
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3178
- 発行年:
- 1997
- 開始ページ:
- 230
- 終了ページ:
- 237
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819426048 [0819426040]
- 言語:
- 英語
- 請求記号:
- P63600/3178
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
SPIE - The International Society for Optical Engineering |
9
国際会議録
YIELD STRESS OF CZOCHRALSKI SILICON- THE EFFECT OF IMPURITIES AND OXYGEN PRECIPITATE MORPHOLOGY
Materials Research Society |
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SPIE - The International Society for Optical Engineering |
Electrochemical Society |