Internal Friction due to Defects in Semiconductors

Internal Friction due to Defects in Semiconductors

著者名:

掲載資料名:

Point and extended defects in semiconductors

シリーズ名:

NATO ASI series. Series B, Physics

シリーズ巻号:

202

発行年:

1989

開始ページ:

65

終了ページ:

75

総ページ数:

11

出版情報:

New York: Plenum Press

ISBN:

9780306433368 [0306433367]

言語:

英語

請求記号:

N11479/202

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020005
シリーズID:	PA00000015
会議名:	NATO Advanced research workshop on on Point, Extended, and Surface Defects in Semiconductors ; International School of Materials Science and Technology ; Workshop on Point, Extended, and Surface Defects in Semiconductors
回次:	1988 ; 1988 ; 2nd
会議開催地:	Erice, Italy
会議開催年:	1988.11.02-1988.11.07

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