Absolute measurement of photodetector quantum efficiency based on spontaneous parametric down-conversion biphoton field

Absolute measurement of photodetector quantum efficiency based on spontaneous parametric down-conversion biphoton field

著者名:

Sun,L. ( Xi'an Jiaotong Univ. )
Zhang,Y.
Tang,T.
Yang,Z.S.
Hou,X.

掲載資料名:

Photonic Systems and Applications in Defense and Manufacturing

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3898

発行年:

1999

開始ページ:

324

終了ページ:

330

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819435002 [0819435007]

言語:

英語

請求記号:

P63600/3898

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019947
シリーズID:	PA00000029
会議名:	International Symposium on Photonics and Applications : Photonic Systems and Applications in Defense and Manufacturing
回次:	1999
会議開催地:	Singapore
会議開催年:	1999.12.01-1999.12.03

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