Blank Cover Image

Optical characteristics of PZT thin-film actuator-driven micro-optical scanning sensor with multilayer stacked device structure

著者名:
Totani,H. ( OMRON Corp. )
Ikeda,M.
Akiba,A.
Masuda,T.
Goto,H.
Matsumoto,M.
さらに 1 件
掲載資料名:
Miniaturized Systems with Micro-Optics and MEMS
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3878
発行年:
1999
開始ページ:
199
終了ページ:
206
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434753 [0819434752]
言語:
英語
請求記号:
P63600/3878
資料種別:
国際会議録

類似資料:

Wakabayashi,S., Totani,H., Sakata,M., Ikeda,M., Goto,H., Takeuchi,M., Yada,T.

SPIE-The International Society for Optical Engineering

Takagi, H., Park, J. H., Mizoguchi, M., Nishimura, K., Uchida, H., Lebedev, M., Akedo, J., Inoue, M.

Materials Research Society

Ikeda,M., Goto,H., Totani,H., Sakata,M., Yada,T.

SPIE-The International Society for Optical Engineering

Wen, C.Y., Cheng, C.H., Jian, C.N., Nguyen, T.A., Hsu, C.Y., Su, Y.R.

Trans Tech Publications

H. Totani, H. Goto, M. Ikeda, T. Yada

Society of Photo-optical Instrumentation Engineers

Ikeda,M., Morino,T., Takahashi,Y., Onodera,H.

SPIE - The International Society for Optical Engineering

H. Goto, S. Wakabayashi, M. Ikeda, M. Sakata, K. Imanaka

Society of Photo-optical Instrumentation Engineers

Park J. H, Akedo J., Levedev M., Sato H.

SPIE - The International Society of Optical Engineering

Goto,H.

SPIE-The International Society for Optical Engineering

Zakar, E., Dubey, M., Polcawich, R., Piekarski, B., Piekarz, R., Conrad, J., Widuta, R.

MRS-Materials Research Society

Lin,W.-M., Schroth,A., Matsumoto,S., Lee,C., Maeda,R.

SPIE - The International Society for Optical Engineering

Matsumoto, T., Mimoto, K., Kiuchi, M., Sugimoto, S., Goto, S.

MRS-Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12