Some ways to improve the recognition of imperfections in large-scale components using shearography
- 著者名:
- Osten,W. ( BIAS-Bremer Institut fur Angewandte Strahltechnik )
- Kalms,M.K.
- Juptner,W.P.O.
- 掲載資料名:
- Interferometry '99 : applications : 20-23 September 1999, Pułtusk, Poland
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3745
- 発行年:
- 1999
- 開始ページ:
- 244
- 終了ページ:
- 256
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432278 [081943227X]
- 言語:
- 英語
- 請求記号:
- P63600/3745
- 資料種別:
- 国際会議録
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