Blank Cover Image

DIFFUSION OF Ge ALONG GRAIN BOUNDARIES DURING OXIDATION OF POLYCRYSTALLINE SILICON-GERMANIUM FILMS

著者名:
掲載資料名:
Defect-interface interactions : symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
319
発行年:
1994
開始ページ:
183
出版情報:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992184 [1558992189]
言語:
英語
請求記号:
M23500/319
資料種別:
国際会議録

類似資料:

1 国際会議録 OXIDATION OF EPITAXIAL- AND POLYCRYSTALLINE-SiGe ALLOYS

Tsutsu, Hiroshi, Edwards, William J., Ast, Dieter G., Kamins, Theodore I.

MRS - Materials Research Society
7 国際会議録 *ELECTRICAL PROPERTIES OF POLYCRYSTALLINE-SILICON THIN FILMS FOR VLSI

Kamins, T.I.

Materials Research Society
2 国際会議録 A STEM Study of P and Ge Segregation to Grain Boundaries in Si].xGex Thin Films

Ast, D. G., Kamins, T. I., Qin, W.

Materials Research Society
8 国際会議録 High resolution electron microscopy of grain boundaries in silicon

Cunningham, B., Ast, D.

North-Holland
3 国際会議録 Resistivity And Hall Voltage Investigation Of Phosphorus Segregation In Polycrystalline Si,.xGex Thin Films

Ast, D. G., Kamins, T. I., Qin, W.

Materials Research Society
9 国際会議録 FABRICATION AND PROPERTIES OF SINGLE, DOUBLE, AND TRIPLE GATE POLYCRYSTALLINE-SILICON THIN FILM TRANSISTORS

Proano, R. E., Soave, R. J., Ast, D. G.

Materials Research Society
4 国際会議録 DOPANT IMPLANTATION AND ACTIVATION IM POLYCRYSTALLINE-SiGe

Edwards, W. J., Chieh, Yuen-Shung, Lin, Samuel, Ast, D. G., Krusius, J. P., Kamins, T. I.

MRS - Materials Research Society
10 国際会議録 Silicon epitaxy and oxidation

Meindl D. J., Dutton W. R., Saraswat C. K., Plummer D. J., Kamins I. T., Deal E. B.

Noordhoff International Publishing
5 国際会議録 High Resolution Electron Microscopy (HREM) Study Of Chemically Vapor Deposited Polycrystalline Sil-xGex Thin Films

Ast, D. G., Kamins, T. I., Qin, W.

Materials Research Society
11 国際会議録 A Grain Boundary Defect in Polycrystalline Films

Rutledge, K. M. McNamara, Watkins, G. D., Zhou, X.

MRS - Materials Research Society
6 国際会議録 MEASUREMENTS OF GRAIN BOUNDARY TRAP DENSITY AND HYDROGEN DIFFUSIVITY IN POLYCRYSTALLINE SILICON FET’S

Moore, Chad B., Ast, Dieter G.

Materials Research Society
12 国際会議録 Grain Boundary Grooving in Polycrystalline Oxides and Surface Diffusion Coefficient in Polycrystalline Alumina

Tsoga,A., Sotiropoulou,D., Nikolopoulos,P.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12