ATOMIC SCALE INTERFACE STRUCTURE OF In0.2Ga0.8As/GaAs STRAINED LAYERS STUDIED BY CROSS-SECTIONAL SCANNING TUNNELING MICROSCOPY
- 著者名:
- 掲載資料名:
- Defect-interface interactions : symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 319
- 発行年:
- 1994
- 開始ページ:
- 111
- 出版情報:
- Pittsburgh, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992184 [1558992189]
- 言語:
- 英語
- 請求記号:
- M23500/319
- 資料種別:
- 国際会議録
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