Blank Cover Image

Evaluation of Copper Penetration in Low-ヲハ Polymer Dielectrics by Bias-Temperature Stress

著者名:
Loke, A. L. S.
Wong, S. S.
Talwalkar, N. A.
Wetzel, J. T.
Townsend, P. H.
Tanabe, T.
Vrtis, R. N.
Zussman, M. P.
Kumar, D.
さらに 4 件
掲載資料名:
Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
564
発行年:
1999
開始ページ:
535
出版情報:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994713 [1558994718]
言語:
英語
請求記号:
M23500/564
資料種別:
国際会議録

類似資料:

Kumar, D., Loke, A. L. S., Talwalkar, N. A., Tanabe, T., Townsend, P. H., Vrtis, R. N., Wetzel, J. T., Wong, S. S., …

Materials Research Society

P. Townsend

Electrochemical Society

Wong, S. Simon, Loke, Alvin L. S., Wetzel, Jeffrey T., Townsend, Paul H., Vrtis, Raymond N., Zussman, Melvin P.

MRS - Materials Research Society

Townsend, P.

Electrochemical Society

Ramos, Teresa, Wallace, Steve, Smith, Douglas M.

MRS - Materials Research Society

Shibaeva P. R., Khasanov S. S., Kushch D. N., Yagubskii B. E., Boubekeur K., Batail P., Canadell E.

Kluwer Academic Publishers

Weil, K. S., Kumta, P. N.

MRS - Materials Research Society

Aibar P., Juan A., Vidal E.

Springer

Chen, S., Lai, J., Milthorpe, J., Mudford, N.

American Institute of Aeronautics and Astronautics

Lucke, Jurgen R., Gallus, Heinz E.

The American Society of Mechanical Engineers

Loke, Alvin L. S., Wetzel, Jeffrey T., Stankus, John J., Wong, S. Simon

MRS - Materials Research Society

Farrell, H.M., Cooke, P.H., King, G., Hoagland, P.D., Groves, M.L., Kumosinski, T.F., Chu, B.

American Chemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12