IN-SITU, REAL-TIME ANALYSIS OF THE GROWTH OF FERROELECTRIC AND CONDUCTIVE OXIDE HETEROSTRUCTURES BY A NEW TIME-OF-FLIGHT PULSED ION BEAM SURFACE ANALYSIS TECHNIQUE

IN-SITU, REAL-TIME ANALYSIS OF THE GROWTH OF FERROELECTRIC AND CONDUCTIVE OXIDE HETEROSTRUCTURES BY A NEW TIME-OF-FLIGHT PULSED ION BEAM SURFACE ANALYSIS TECHNIQUE

著者名:

掲載資料名:

Epitaxial oxide thin films and heterostructures : symposium held April 5-7, 1994, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

341

発行年:

1994

開始ページ:

385

出版情報:

Pittsburgh, Pa: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992412 [1558992413]

言語:

英語

請求記号:

M23500/341

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019829
シリーズID:	PA00000011
会議名:	Symposium on epitaxial oxide thin films and heterostructures
回次:	1994
会議開催地:	San Francisco, CA, USA
会議開催年:	1994.04.05-1994.04.07

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