Neutron depth profiling of elemental concentration using a focused beam

Neutron depth profiling of elemental concentration using a focused beam

著者名:

Chen-Mayer,H.H. ( National Institute of Standards and Technology )
Lamaze,G.P.
Mildner,D.F.R.
Downing,R.G.

掲載資料名:

International Conference Neutrons in Research and Industry

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2867

発行年:

1997

開始ページ:

140

終了ページ:

143

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819422637 [0819422630]

言語:

英語

請求記号:

P63600/2867

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019808
シリーズID:	PA00000029
会議名:	International Conference Neutrons in Research and Industry
回次:	1995
会議開催地:	Crete, Greece
会議開催年:	1996.06.09-1996.06.15

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