Automated visual inspection of LCD modules
- 著者名:
- 掲載資料名:
- Applications of digital image processing XIX : 7-9 August 1996, Denver, Colorado
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2847
- 発行年:
- 1996
- 開始ページ:
- 324
- 終了ページ:
- 330
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819422354 [0819422355]
- 言語:
- 英語
- 請求記号:
- P63600/2847
- 資料種別:
- 国際会議録
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4
国際会議録
Automated visual inspection stations for next-generation semiconductor package quality control
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
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SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |