Use of near-field scanning optical microscopy(NSOM)to characterize optical channel waveguide structures
- 著者名:
Naghski,D.H. ( Univ.of Cincinnati ) Lindsay,S.M. Poweleit,C.D. Brabander,G.N.De Subramaniam,V. Jackson,H.E. Boyd,J.T. - 掲載資料名:
- Integrated Optics and Microstructures III
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2686
- 発行年:
- 1996
- 開始ページ:
- 64
- 終了ページ:
- 72
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819420602 [0819420603]
- 言語:
- 英語
- 請求記号:
- P63600/2686
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
Kluwer Academic Publishers |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
4
国際会議録
CHARACTERIZATION OF Ti:LiNbO3 OPTICAL CHANNEL WAVEGUIDES FABRICATED USING RAPID THERMAL ANNEALING
Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Materials Research Society |