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Transmission Electron Microscopy and Microanalysis of Extended Defects in Ceramics

著者名:
掲載資料名:
Defects in electronic ceramics
シリーズ名:
Materials science forum
シリーズ巻号:
116
発行年:
1993
開始ページ:
149
終了ページ:
168
出版情報:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496532 [087849653X]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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