Blank Cover Image

Spectromicroscopy: some developments at BESSY

著者名:
掲載資料名:
Chemical, structural, and electronic analysis of heterogeneous surfaces on nanometer scale
シリーズ名:
NATO ASI series. Series E, Applied sciences
シリーズ巻号:
333
発行年:
1997
開始ページ:
93
終了ページ:
102
総ページ数:
10
出版情報:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792344896 [0792344898]
言語:
英語
請求記号:
N11482/333
資料種別:
国際会議録

類似資料:

Jung,Ch., Bahrdt,J., Flechsig,U., Weiss,M.R.

SPIE-The International Society for Optical Engineering

Lorusso, G. F., Solak, H., Cerrina, F., Underwood, J. H., Batson, P. J., Kim, Y., Cho, Y., Kisielowski, C., Krueger, J., …

MRS - Materials Research Society

Umbach, A.

SPIE-The International Society for Optical Engineering

Winn,B., Hao,X., Jacobsen,C.J., Kirz,J., Miao,J., Wirick,S., Ade,H., Buckley,C.J., Howells,M.R., Hulbert,S.L., …

SPIE-The International Society for Optical Engineering

A. Umbach

Society of Photo-optical Instrumentation Engineers

Tanaka, S., Umbach, C. C., Blakely, J. M., Tromp, R. M., Mankos, M.

MRS - Materials Research Society

Ulm, G., Beckhoff, B., Klein, R., Krumrey, M., Rabus, H., Thornagel, R.

SPIE

Weiss A. R., Fu Y., Gan P. P., Bessette D. M.

Society of Plastics Engineers, Inc. (SPE)

Kraft,S., Scholze,F., Thornagel,R., Ulm,G., McDermott,W. C., Kellogg,E. M.

SPIE-The International Society for Optical Engineering

Yanisko J. P., Weiss A. R.

Society of Plastics Engineers, Inc. (SPE)

Bijkerk,F., Beckhoff,B., Brandt,G., Fliegauf,R., Klein,R., Meyer,B., Rost,D., Schmitz,D., Veldkamp,M., Weser,J., Ulm,G., …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12