Mohnen A. V., Rummukainen M., Bojkov D. R., De Muer D., Fortuin F. P. J., Haugland O. S., Liu M. C., Marenco A., Megie …
Springer
|
Fehsenfeld, F., Hov., O., Ancellet, G.A., Cox, R.A., Ehhalt, D., Hakola, H., Legrand, M., Liu, S.
Kluwer Academic Publishers
|
Willis H. D., Doidge M. C., Hapgood A. M., Yau C. K. K., Stephenson R. F.
Kluwer
|
D.P. Wylie
Society of Photo-optical Instrumentation Engineers
|
Abbas, M. M., Michelsen, H. A., Gunson, M. R., Abrams, M. C., Newchurch, M. J., Salawitch, R. J., Chang, A. Y., Goldman, …
National Aeronautics and Space Adminstration
|
Beiden,S.V., Wagner,R.F., Campbell,G., Metz,C.E., Chan,H.-P., Nishikawa,R.M., Schnall,M.D., Jiang,Y.
SPIE-The International Society for Optical Engineering
|
Long,D.C., Watt,G., Hardin,P.J.
SPIE - The International Society for Optical Engineering
|
Hoppe, U.-P., Hansen, G., Opsvik, D.
ESA Publications Division
|
Preusse, P., Ern, M., Grossmann, K.U., Mergenthaler, J.L.
SPIE - The International Society of Optical Engineering
|
Vries,J.de, Oord,G.H.J.van den, Hilsenrath,E., Plate,M.B.te, Levelt,P.F., Dirksen,R.
SPIE-The International Society for Optical Engineering
|
Ehhalt H. D., Rohrer F., Wahner A.
Springer-Verlag
|
Kins, L., Muller, K.P., Ehhalt, D.H., Meixner, F.X.
Kluwer Academic Publishers
|