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Automatic measurement equipment for quality control in the loop-slitting department

著者名:
掲載資料名:
Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3897
発行年:
1999
開始ページ:
328
終了ページ:
334
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434999 [081943499X]
言語:
英語
請求記号:
P63600/3897
資料種別:
国際会議録

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