Real-time diffraction efficiency in lithium niobate at 532 nm

Real-time diffraction efficiency in lithium niobate at 532 nm

著者名:

Jayanth,P. ( Ngee Ann Polytechnic )
Luen,S.Y.

掲載資料名:

Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3897

発行年:

1999

開始ページ:

56

終了ページ:

62

出版情報:

Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819434999 [081943499X]

言語:

英語

請求記号:

P63600/3897

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019484
シリーズID:	PA00000029
会議名:	International Symposium on Photonics and Applications : Advanced photonic sensors and applications
回次:	1999
会議開催地:	Singapore
会議開催年:	1999.11.30-1999.12.03

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