Blank Cover Image

Optimization of cantilever probes for atomic force microscopy

著者名:
Pedersen,N.F. ( Technical Univ.of Denmark )  
掲載資料名:
Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3680
発行年:
1999
巻:
Part1
開始ページ:
131
終了ページ:
140
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431547 [0819431540]
言語:
英語
請求記号:
P63600/3680
資料種別:
国際会議録

類似資料:

1 国際会議録 Carbon nanotube atomic force microscopy cantilevers

Emirov, Y.N., Schumacher, J.D., Lagel, B., Nguyen, N., Ren, Z., Huang, Z., Rossie, B.B., Schlaf, R.

SPIE - The International Society of Optical Engineering
7 国際会議録 Miniaturized atomic force microscope for planetary exploration

Gautsch, S., Staufer, U., Akiyama, T., de Rooij, N.F., Hidber, H.R., Tonin, A., Mueller, D., Howald, L., Niedermann, P.

ESA Publications Division
2 国際会議録 Probing field distributions on waveguide structures with an atomic force/photon scanning tunneling microscope

E.G. Borgonjen, M.H.P. Moers, A.G.T. Ruiter, N.F. van Hulst

Society of Photo-optical Instrumentation Engineers
8 国際会議録 MILLIMETER AND SUB-MM WAVE JOSEPHSON FLUX-FLOW DEVICES

Mygind,J., Pedersen,N.F.

Kluwer Academic Publishers
3 国際会議録 Quantitative probing in atomic force microscopy of polymer surfaces

Bliznyuk, Valery N., Hazel, John L., Wu, John, Tsukruk, Vladimir V.

American Chemical Society
9 国際会議録 Characterization of conductive probes for atomic force microscopy

Trenkler,T., Hantschel,T., Vandervorst,W., Hellemans,L., Kulisch,W., Oesterschulze,E., Niedermann,P., Sulzbach,T.

SPIE - The International Society for Optical Engineering
4 国際会議録 Noise in atomic force microscopy images

P. S. Timashev, N. A. Aksenova, A. B. Solovieva, S. F. Timashev

SPIE - The International Society of Optical Engineering
10 国際会議録 Carbon nanotube atomic force microscopy probes

SPIE - The International Society of Optical Engineering
5 国際会議録 Peel-off probe: a cost-effective probe for electrical atomic force microscopy

Hantschel,T., Slesazeck,S., Duhayon,N., Xu,M., Vandervorst,W.

SPIE-The International Society for Optical Engineering
11 国際会議録 Characterization of silicon cantilevers with integrated pyramidal metal tips in atomic force microscopy

Hantschel,T., Stephenson,R., Trenkler,T., Wolf,P.De, Vandervorst,W.

SPIE - The International Society for Optical Engineering
6 国際会議録 Atomic force microscopy using small cantilevers

Walters,D.A., Viani,M., Paloczi,G.T., Schaffer,T.E., Cleveland,J.P., Wendman,M.A., Gurley,G., Elings,V., Hansma,P.K.

SPIE-The International Society for Optical Engineering
12 国際会議録 ATOMIC FORCE MICROSCOPY OF POLYMER SURFACES

Unertl N. W., Jin X.

Kluwer Academic Publishers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12