High-numerical-aperture objective lenses and optical system improved objective type total internal reflection fluorescence microscopy
- 著者名:
Kawano,Y. ( Olympus America,Inc. ) Abe,C. Kaneda,T. Aono,Y. Abe,K. Tamurap,K. Terakawa,S. - 掲載資料名:
- Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4098
- 発行年:
- 2000
- 開始ページ:
- 142
- 終了ページ:
- 151
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819437433 [0819437433]
- 言語:
- 英語
- 請求記号:
- P63600/4098
- 資料種別:
- 国際会議録
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