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Research on the near-field distribution of nanometric apertures:fiber optic probes and the influence of parameters of metal-coated probes

著者名:
掲載資料名:
Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4098
発行年:
2000
開始ページ:
128
終了ページ:
137
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437433 [0819437433]
言語:
英語
請求記号:
P63600/4098
資料種別:
国際会議録

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