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Effective Bayesian inference by data-driven Markov chain Monte Carlo for object recognition and image segmentation

著者名:
掲載資料名:
Automatic target recognition X : 26-28 April 2000, Orlando, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4050
発行年:
2000
開始ページ:
320
終了ページ:
332
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436764 [0819436763]
言語:
英語
請求記号:
P63600/4050
資料種別:
国際会議録

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