Effective Bayesian inference by data-driven Markov chain Monte Carlo for object recognition and image segmentation
- 著者名:
- 掲載資料名:
- Automatic target recognition X : 26-28 April 2000, Orlando, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4050
- 発行年:
- 2000
- 開始ページ:
- 320
- 終了ページ:
- 332
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436764 [0819436763]
- 言語:
- 英語
- 請求記号:
- P63600/4050
- 資料種別:
- 国際会議録
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Geometrical and Topological Information for Image Segmentation with Monte Carlo Markov Chain Implementation.
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