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T-CAT:a new thermal camera acuity tester

著者名:
掲載資料名:
Infrared imaging systems : design, analysis, modeling, and testing XI : 26-27 April 2000, Orlando, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4030
発行年:
2000
開始ページ:
232
終了ページ:
238
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436566 [0819436569]
言語:
英語
請求記号:
P63600/4030
資料種別:
国際会議録

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