T-CAT:a new thermal camera acuity tester
- 著者名:
- Valeton,J.M. ( TNO )
- Bijl,P.
- Agterhuis,E.
- Kriekaard,S.
- 掲載資料名:
- Infrared imaging systems : design, analysis, modeling, and testing XI : 26-27 April 2000, Orlando, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4030
- 発行年:
- 2000
- 開始ページ:
- 232
- 終了ページ:
- 238
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436566 [0819436569]
- 言語:
- 英語
- 請求記号:
- P63600/4030
- 資料種別:
- 国際会議録
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