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Structural characterization and raman studies of SrBi2Ta0.8Nb1.2O9 thin films

著者名:
Srinivas, S.
Das, R. R.
Mercoda, J.
Fachini, E. R.
Perez, W.
Katiyar, R. S.
さらに 1 件
掲載資料名:
Ferroelectric thin films VIII : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
596
発行年:
2000
開始ページ:
191
出版情報:
Warrendale, PA: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558995048 [1558995048]
言語:
英語
請求記号:
M23500/596
資料種別:
国際会議録

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