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Correlation Between Defect Structures and Light Emission in Si-Nanocrystal Doped SiO2 Films

著者名:
Sato, K.
Sugiyama, Y.
Izumi, T.
Iwase, M.
Show, Y.
Nozaki, S.
Morisaki, H.
さらに 2 件
掲載資料名:
Microcrystalline and nanocrystalline semiconductors--1998 : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
536
発行年:
1999
開始ページ:
57
出版情報:
Warrendale, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994423 [1558994424]
言語:
英語
請求記号:
M23500/536
資料種別:
国際会議録

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