Blank Cover Image

Defects in Erbium/Oxygen Implanted Silicon

著者名:
Duan, X.
Palm, J.
Zheng, B.
Morse, M.
Michel, J.
Kimerling, L. C.
さらに 1 件
掲載資料名:
Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
442
発行年:
1997
開始ページ:
249
出版情報:
Pittsburgh, Penn: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993464 [1558993460]
言語:
英語
請求記号:
M23500/442
資料種別:
国際会議録

類似資料:

Ahn,S.H., Palm,J., Zheng,B., Duan,X., Agarwal,A.M., Nelson,S.F., Michel,J., Kimerling,L.C.

SPIE-The International Society for Optical Engineering

Michel, J., Zheng, B., Palm, J., Ouellette, E., Gan, F., Kimerling, L. C.

MRS - Materials Research Society

Duan, Xiaoman, Ohno, Yutaka, Michel, Jurgen, Kimerling, Lionel C.

Materials Research Society

Stolfi, M., Dal-Negro, L., Michel, J., Duan, X., Le-Blanc, J., Haavisto, J., Kimerling, L. C.

Materials Research Society

Morse, M., Zheng, B., Palm, J., Duan, X., Kimerling, L. C.

MRS - Materials Research Society

Michel,J., Palm,J., Chen,T., Duan,X., Oullette,E., Ahn,S.H., Nelson,S.F., Kimerling,L.C.

Trans Tech Publications

Chen,T.D., Agarwal,A.M., Giovane,L.M., Foresi,J.S., Liao,L., Lim,D.R., Morse,M.T., Ouellette,E.J., Ahn,S.H., Duan,X., …

SPIE-The International Society for Optical Engineering

Michel,J., Kimerling,L.C., Benton,J.L., Eaglesham,D.J., Fitzgerald,E.A., Jacobson,D.C., Poate,J.M., Xie,Y.-H., …

Trans Tech Publications

Kimerling, L.C., Koker, D.M., Zheng, B., Ren, F.Y.G., Michel, J.

Electrochemical Society

Agarwal, A., Foresi, J.S., Giovane, L.M., Liao, L., Michel, J., Wada, K., Kimerling, L.C.

Electrochemical Society

Michel,J., Palm,J., Gan,F., Ren,F.Y.G., Zheng,B., Dunham,S.T., Kimerling,L.C.

Trans Tech Publications

Giovane, L. M., Lim, D. R., Ahn, S. H., Chen, T. D., Foresi, J. S., Liao, L., Oulette, E. J., Agarwal, A. M., Duan, X., …

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12