Defect detection in apples by means of x-ray imaging

Defect detection in apples by means of x-ray imaging

著者名:

Schatzki,T.F. ( USDA Agricultural Research Service )

掲載資料名:

Optics in Agriculture, Forestry, and Biological Processing II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2907

発行年:

1996

開始ページ:

176

終了ページ:

185

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819423092 [0819423092]

言語:

英語

請求記号:

P63600/2907

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019349
シリーズID:	PA00000029
会議名:	Photonics East : Optics in Agriculture, Forestry, and Biological Processing
回次:	1996 : 2nd
会議開催地:	Boston, MA, USA
会議開催年:	1996.11.19-1996.11.20

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