Near-UV to IR optical characterization of YF3 thin films deposited by evaporation and ion beam processes

Near-UV to IR optical characterization of YF3 thin films deposited by evaporation and ion beam processes

著者名:

Quesnel,E. ( LETI/CEA/DOPT )

掲載資料名:

Developments in optical component coatings : 15-16 May, 1996, Glasgow, Scotland, UK

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2776

発行年:

1996

開始ページ:

366

終了ページ:

372

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421616 [0819421618]

言語:

英語

請求記号:

P63600/2776

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019336
シリーズID:	PA00000029
会議名:	Optical Instrumentation & System Design : Developments in optical component coatings
回次:	1996
会議開催地:	Glasgow, Scotland, UK
会議開催年:	1996.05.15-1996.05.16

類似資料:

1 国際会議録 Residual stress,composition,and optical properties of SiOxNy thin films deposited by dual ion beam sputtering Robic,J.Y., Leplan,H., Berger,M., Chaton,P., Quesnel,E., Lartigue,O., Pelle,C., Pauleau,Y., Pierre,F. SPIE-The International Society for Optical Engineering	7 国際会議録 Optical characterization of materials desposited by different processes: the LaF3 in the UV-visible region Bosch,S., Leinfellner,N., Quesnel,E., Duparre,A., Ferre-Borrull,J., Guenster,S., Ristau,D. SPIE-The International Society for Optical Engineering
2 国際会議録 Laser damage of optical coatings from UV to deep UV at 193 nm Dijon,J., Quesnel,E., Pelle,C., Thielsch,R. SPIE - The International Society for Optical Engineering	8 国際会議録 New Spectroscopic Data of Erbium Ions in GuN Thin Films * Pelle, F., Auzel, F., Zavada, J.M., Lee, D.S., Stecki, A.J. Electrochemical Society
3 国際会議録 FLUORESCENCE DYNAMICS OF Er3+ IONS IN MBE-GROWN GaN-THIN FILMS Pelle, F., Auzel, F., Zavada, J.M., Hommerich, U., Lee, D.S., Steckl, A.J. Kluwer Academic Publishers	9 国際会議録 UV-optical and microstructural properties of MgF2 coatings deposited by IBS and PVD processes Ristau,D., Arens,W., Bosch,S., Duparre,A., Masetti,E., Jacob,D., Kiriakidis,G., Peiro,F., Quesnel,E., Tikhonravov,A.V. SPIE - The International Society for Optical Engineering
4 国際会議録 Comparative study of IR and UV laser damage resistance of silica thin films deposited by electron beam deposition, ion plating, ion assisted deposition and dual … Gallais, L., Krol, H., Capoulade, J., Cathelinaud,M., Roussel, L., Albrand, G., Natoli, J. -Y., Commandre, M., Lequime, … SPIE - The International Society of Optical Engineering	10 国際会議録 CHARACTERIZATION AND PERFORMANCE OF CARBON FILMS DEPOSITED BY PLASMA AND ION BEAM BASED TECHNIQUES Walter, K. C., Kung, H., Levine, T., Tesmer, J. T., Kodali, P., Wood, B. P., Rej, D. J., Nastasi, M., Koskinen, J., … MRS - Materials Research Society
5 国際会議録 *PROCESSING AND STRUCTURAL CHARACTERIZATION OF FERROELECTRIC THIN FILMS DEPOSITED BY ION BEAM SPUTTERING Ameen, M.S., Graettinger, T.M., Rou, S.H., Al-Shareef, H.N., Gifford, K.D., Auciello, O., Kingon, A.I. Materials Research Society	11 国際会議録 Electrical Characterization of Platinum Thin Films Deposited by Focused Ion Beam M. M. da Stiva, A. R. Vaz, S. A. Moshkalev, J. W. Swart Electrochemical Society
6 国際会議録 Characterization of Gd2O3 Films Deposited on Si(l00) by E-Beam Evaporation from Pressed-Powder Targets Landheer, D., Gupta, J., Hulse, J., Sproule, I., McCaffrey, J., Graham, M., Yang, K.-C., Lu, Z., Lennard, W.N. Electrochemical Society	12 国際会議録 New procedure for the optical characterization of high-quality thin films Bosch,S., Leinfellner,N., Quesnel,E., Duparre,A., Ferre-Borrull,J., Gunster,S., Ristau,D. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12