Effect of silica overlayers on laser damage of HfO2-SiO256｡ｬ incidence high reflectors

Effect of silica overlayers on laser damage of HfO2-SiO256｡ｬ incidence high reflectors

著者名:

Walton,C.C. ( Lawrence Livermore National Lab. )

掲載資料名:

27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2714

発行年:

1996

開始ページ:

550

終了ページ:

559

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420893 [0819420891]

言語:

英語

請求記号:

P63600/2714

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019330
シリーズID:	PA00000029
会議名:	Laser Damege : Annual Boulder Damage Symposium - Laser-Induced Damage in Optical Materials
回次:	1995 : 27th
会議開催地:	Boulder, CO, USA
会議開催年:	1995.10.30-1995.11.01

類似資料:

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2 国際会議録 Effect of electric field distribution on the morphologies of laser-induced damage in hafnia-silica multilayer polarizers Genin,F.Y., Stolz,C.J., Reitter,T.A., Kozlowski,M.R., Bevis,R.P., Gunten,M.K.Von SPIE-The International Society for Optical Engineering	8 国際会議録 Surface-contamination-initiated laser damage Feit,M.D., Rubenchik,A.M., Faux,D.R., Riddle,R.A., Shapiro,A.B., Eder,D.C., Penetrante,B.M., Milam,D., Genin,F.Y., … SPIE-The International Society for Optical Engineering
3 国際会議録 Effect of SiO2 overcoat thickness on laser damage morphology of HfO2/SiO2 Brewster's angle polarizers at 1064 nm Stolz,C.J., Genin,F.Y., Reitter,T.A., Molau,N.E., Bevis,R.P., Gunten,M.K.Von, Smith,D.J., Anzellotti,J.F. SPIE-The International Society for Optical Engineering	9 国際会議録 Modeling of laser damage initiated by surface contamination Feit,M.D., Rubenchik,A.M., Faux,D.R., Riddle,R.A., Shapiro,A.B., Eder,D.C., Penetrante,B.M., Milam,D., Genin,F.Y., … SPIE-The International Society for Optical Engineering
4 国際会議録 Laser-induced damage of fused silica at 355 and 1064 nm initiated at aluminum contamination particles on the surface Genin,F.Y., Michlitsch,K., Furr,J., Kozlowski,M.R., Krulevitch,P. SPIE-The International Society for Optical Engineering	10 国際会議録 Catastrophic failure of contaminated fused-silica optics at 355 nm Genin,F.Y., Kozlowski,M.R., Brusasco,R.M. SPIE-The International Society for Optical Engineering
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