Blank Cover Image

Defects in neutron-irradiated LEC semi-insulating-GaAs

著者名:
掲載資料名:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
シリーズ名:
Materials science forum
シリーズ巻号:
258-263
発行年:
1997
巻:
Part2
開始ページ:
1039
終了ページ:
1044
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497881 [0878497889]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

Castaldini, A., Cavallini, A., Polenta, L., Canali, C., Nava, F., Puente, E. de la, Alvarez, A., Jimenez, J.

MRS - Materials Research Society

MARES,J.A., OSWALD,J., PASTRNAK,J.

Trans Tech Publications

Manasreh, M.O., Pearah, P.J.

Materials Research Society

Kuriyama,K., Sakai,K., Kato,T., Iijima,T., Okada,M., Yokoyama,K.

Trans Tech Publications

Fang, Zhaoqiang,, Shan, Lei, Schlesinger, T.E., Milnes, A.G.

Materials Research Society

Kazukauskas, V., Kuprusevicius, E., Vaitkus, J.-V., Smith, K.M.

Trans Tech Publications

Mizeikis,V., Jarasiunas,K., Storasta,J., Gudelis.V., Bastiene,L., Sudzius,M.

SPIE-The International Society for Optical Engineering

Saarinen,K., Kuisma,S., Makine,J., Hautojarvi,P., Tornqvist,M., Corbel,C.

Trans Tech Publications

Koztowski,R., Pawiowski,M., Kaminski,P., Cwirko,J.

SPIE - The International Society for Optical Engineering

Yoshida,H., Kiyama,M., Takebe,T., Yamashita,M., Fujita,K.

Trans Tech Publications

KLEIN,P.B., HENRY,R.L., KENNEDY,T.A., WILSEY,N.D.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12