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Defect control in As-rich GaAs

著者名:
Specht,P.
Jeong,S.
Sohn,H.
Luysberg,M.
Prasad,A.
Gebauer,J.
Krausse-Rehberg,R.
Weber,E.R.
さらに 3 件
掲載資料名:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
シリーズ名:
Materials science forum
シリーズ巻号:
258-263
発行年:
1997
巻:
Part2
開始ページ:
951
終了ページ:
956
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497881 [0878497889]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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