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Investigation of ion-implanted boron in diamond

著者名:
Bharuth-Ram,K.
Ittennann,B.
Metzner,H.
Fullgrabe,M.
Heemeier,M.
Kroll,F.
Mai,F.
Matbach,K.
Meier,P.
Peters,D.
Thiess,H.
Ackermann,H.
Selischop,J.P.F.
Stockmann,H.-J.
Uhrmacher,M.
さらに 10 件
掲載資料名:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
シリーズ名:
Materials science forum
シリーズ巻号:
258-263
発行年:
1997
巻:
Part2
開始ページ:
763
終了ページ:
768
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497881 [0878497889]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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