Blank Cover Image

Internal diagnostics for FT-IR spectrometry

著者名:
  • Simonds,J.A. ( Technical Products Group,Inc. )
  • Costello,W.E. ( Technical Products Group,Inc. )
  • Combs,R.J. ( U.S. Army Edgewood Research,Development and Engineering Ctr. )
  • Kroutil,R.T. ( U.S. Army Edgewood Research,Development and Engineering Ctr. )
掲載資料名:
Electro-optical technology for remote chemical detection and identification II : 21 April 1997, Orlando, Florida
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3082
発行年:
1997
開始ページ:
106
終了ページ:
120
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819424976 [0819424978]
言語:
英語
請求記号:
P63600/3082
資料種別:
国際会議録

類似資料:

Kroutil,R.T., Combs,R.J., Knapp,R.B.

SPIE - The International Society for Optical Engineering

Costello,W.E., Simonds,J.A., Milchling,S.

SPIE-The International Society for Optical Engineering

Kroutil, R.T., Combs, R.J., Knapp, R.B., Small, G.W.

SPIE-The International Society for Optical Engineering

Combs, R. J., Cummings, A. S., Thomas, M. J., Kroutil, R. T.

SPIE - The International Society of Optical Engineering

Knapp, R.B., Combs, R.J., Kroutil, R.T.

SPIE-The International Society for Optical Engineering

R. T. Kroutil, P. E. Lewis, D. P. Miller, S. S. Shen, G. W. Small

Society of Photo-optical Instrumentation Engineers

Combs, R.J., Manning, C.J.

SPIE-The International Society for Optical Engineering

Griffiths R. P.

D. Reidel Pub. Co.

Kroutil,R.T., Combs,R.J., Knapp,R.B.

SPIE - The International Society for Optical Engineering

C.T. Chaffin, T.L. Marshall, R.J. Combs, R.B. Knapp, R.T. Kroutil

Society of Photo-optical Instrumentation Engineers

Kroutil,R.T., Combs,R.J., Knapp,R.B., Godfrey,J.P.

SPIE-The International Society for Optical Engineering

Combs,R.J.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12