Blank Cover Image

Wavelet transform based transient detection

著者名:
Guler E. C.
Sankur B.
Anarim E.
Mendi C. D.
Alkin O.
Kahya Y. P.
Engin T.
さらに 2 件
掲載資料名:
Advances in signal processing for nondestructive evaluation of materials
シリーズ名:
NATO ASI series. Series E, Applied sciences
シリーズ巻号:
262
発行年:
1994
開始ページ:
269
終了ページ:
283
総ページ数:
15
出版情報:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792327653 [0792327659]
言語:
英語
請求記号:
N11482/262
資料種別:
国際会議録

類似資料:

H. Çağlar, O. Alkin, E. Anarim, B. Sankur

Society of Photo-optical Instrumentation Engineers

M. Tello, C. Lopez-Martinez, J. J. Mallorqui

ESA Publications Division

K. Harmanci, E. Anarim, H. Çağlar, B. Sankur

Society of Photo-optical Instrumentation Engineers

Litynski,D.M., Shoop,B.L., Hall,D.A., Das,P.K., DeCusatis,C.M.

SPIE - The International Society for Optical Engineering

Wu,Y., Tao,B.

SPIE-The International Society for Optical Engineering

T. Mzaik, J.M. Jagadeesh

Society of Photo-optical Instrumentation Engineers

Dixon,T.L., Sibul,L.H.

SPIE-The International Society for Optical Engineering

Lu,C.J., Hsu,Y.T.

SPIE - The International Society for Optical Engineering

J. Han, R. Yang, W. Wang

Society of Photo-optical Instrumentation Engineers

Lo,S.-C.B., Makariou,E., Delegacz,A., Chan,H.-P., Dorfman,D.D., Freedman,M.T., Berbaum,K.

SPIE-The International Society for Optical Engineering

Peng,X., Zhou,C., Ding,M.

SPIE-The International Society for Optical Engineering

Wojcik,W., Kotyra,A., Smolarz,A., Komada,P., Wojciechowski,C.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12