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Transmission electron microscopy and diffraction from semiconductor interfaces and surfaces

著者名:
Gibson M. J.  
掲載資料名:
Surface and interface characterization by electron optical methods
シリーズ名:
NATO ASI series. Series B, Physics
シリーズ巻号:
191
発行年:
1988
開始ページ:
55
終了ページ:
76
総ページ数:
22
出版情報:
New York: Plenum Press
ISBN:
9780306430862 [030643086X]
言語:
英語
請求記号:
N11479/191
資料種別:
国際会議録

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