Blank Cover Image

Transmission Electron Microscopy of Defects in Solids

著者名:
Hobbs W. L.  
掲載資料名:
Defects in solids : modern techniques
シリーズ名:
NATO ASI series. Series B, Physics
シリーズ巻号:
147
発行年:
1986
開始ページ:
61
終了ページ:
93
総ページ数:
33
出版情報:
New York: Plenum Press
ISBN:
9780306424748 [0306424746]
言語:
英語
請求記号:
N11479/147
資料種別:
国際会議録

類似資料:

1 国際会議録 Transmission electron microscopy of defects in NMOS and PMOS structures

Bourdillon,A.J., Koh,Y.G., Chiang,S.L., Lim,C.W., Kong,J.R., Guobing,C.

SPIE-The International Society for Optical Engineering
7 国際会議録 STRUCTURAL CRITERIA FOR AMORPHIZATION OF NETWORK SOLIDS

Sreeram, A. N., Hobbs, L. W.

MRS - Materials Research Society
2 国際会議録 Photoluminescence and Transmission Electron Microscopy of Defects in SiC Grown on Si

Choyke,W.J., Powell,J.A., Cheng,T.T., Pirouz,P.

Trans Tech Publications
8 国際会議録 QUANTITATIVE HREM OF ELECTRON-IRRADIATED QUARTZ

Qin, L. C., Hobbs, L. W.

MRS - Materials Research Society
3 国際会議録 CHARACTERIZATION OF THE Ni/NiO REGION IN OXIDIZED HIGH-PURITY NICKEL BY TRANSMISSION ELECTRON MICROSCOPY

Sawhill, Howard T., Hobbs, Linn

Materials Research Society
9 国際会議録 IN-SITU ELECTROMIGRATION STRESSING IN TRANSMISSION ELECTRON MICROSCOPY FOR Al-Cu INTERCONNECTS

Shih, W. C., Greer, A. L.

MRS - Materials Research Society
4 国際会議録 CHARACTERIEATION OF DEFECTS IN SILICON BY TRANSMISSION ELECTRON MICROSCOPY AFTER CMOS AND BIPOLAR PROCESSING

Steed,J.W., Johnson,F., Simpson, M.B., Augustus, P.D.

Materials Research Society
10 国際会議録 Transmission Electron Microscopy and Microanalysis of Extended Defects in Ceramics

Ayache,J., Castaing,J.

Trans Tech Publications
5 国際会議録 Transmission Electron Microscopy Investigation of Defects in B-Implanted 6H-SiC

Persson,P.O.A., Wahab,Q., Hultman,L., Nordell,N., Schoner,A., Rottner,K., Olsson,E., Linnarsson,M.K.

Trans Tech Publications
11 国際会議録 Transmission Electron Microscopy Study of α-Decay Damage in Aeschynite and Britholite

Gong, W. L., Wang, L. M., Ewing, R. C., Chen, L. F., Lutze, W.

MRS - Materials Research Society
6 国際会議録 The Defect Structures of Fe9S10

Nguyen, T., Hobbs, L. W.

North-Holland
12 国際会議録 The transmission electron microscopy of interfaces and multilayers

Stobbs M. W.

Plenum Press
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12