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Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors

著者名:
Kruger,S. ( Humboldt-Univ.zu Berlin )
Wernicke,G.K.
Osten,W.
Kayser,D.
Demoli,N.
Gruber,H.
さらに 1 件
掲載資料名:
Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3966
発行年:
2000
開始ページ:
145
終了ページ:
153
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435842 [0819435848]
言語:
英語
請求記号:
P63600/3966
資料種別:
国際会議録

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