Probing of two-dimensional grid patterns by means of camera-based image processing

Probing of two-dimensional grid patterns by means of camera-based image processing

著者名:

Schroeck,M. ( National Institute of Standards and Technology )
Doiron,T.D.

掲載資料名:

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3966

発行年:

2000

開始ページ:

9

終了ページ:

17

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819435842 [0819435848]

言語:

英語

請求記号:

P63600/3966

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00019029
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Machine vision applications in industrial inspection
回次:	2000 : 8th
会議開催地:	San Jose, CA, USA
会議開催年:	2000.01.24-2000.01.26

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